4 results
Three-Dimensional Observation of Edge-Roughness on Poly-Si/TiN Stacked Gate Using Three-Dimensional STEM
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 634-635
- Print publication:
- July 2009
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Development of New Analytical Approaches by a 300 keV CFE-TEM/STEM
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1780-1781
- Print publication:
- August 2006
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Nonlinear Carrier Relaxation in a Single GaAs Self-organized Quantum Dot
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- Journal:
- MRS Online Proceedings Library Archive / Volume 737 / 2002
- Published online by Cambridge University Press:
- 11 February 2011, E10.3
- Print publication:
- 2002
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Laser Ablation Process and Growth Control of Oxide Thin Films in Laser Molecular Beam Epitaxy
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- Journal:
- MRS Online Proceedings Library Archive / Volume 397 / 1995
- Published online by Cambridge University Press:
- 15 February 2011, 169
- Print publication:
- 1995
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